AERA Annual Meeting: Patrick Meyer, University of Virginia

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Patrick Meyer, University of Virginia

Fri, April 13
2:15 to 3:45pm
Marriott Pinnacle, Floor: Third Level, Dundarave
In Paper Session: Studies in Rasch Conditions and Applications
On Paper: A Study of Rasch, Partial Credit, and Rating Scale Model Parameter Recovery in WINSTEPS and jMetrik
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