AERA Annual Meeting: Teck Yong Lawrence Neo, University of Illinois at Urbana-Champaign

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Teck Yong Lawrence Neo, University of Illinois at Urbana-Champaign

Sun, April 15
10:35am to 12:05pm
Vancouver Convention Centre, Floor: First Level, East Ballroom C
In Event: Roundtable Session 60
In Roundtable Session: Computerized Adaptive Testing Issues
On Roundtable Presentation: Attribute-Level Discrimination Indices for Cognitive Diagnostic Computerized Adaptive Testing
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