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4:05 to 5:35pm
Convention Center, Floor: 100 Level, 109B
In Paper Session: Validity in Systems of Data Use
Chair
10:35am to 12:05pm
Convention Center, Floor: Terrace Level, Terrace IV
In Event: Roundtable Session 14
In Roundtable Session: Effects of Aberrant Response Patterns on Test Scores
Chair
8:15 to 9:45am
Convention Center, Floor: 100 Level, 117
In Paper Session: Test Form Development and Item Exposure
Discussant