- Browse/Search
Search
Program Calendar
Browse By Day
Browse By Time
Browse By Person
Browse By Room
Browse By Unit
Browse By Session Type
Browse By Descriptor
- Information Menu
Search Tips
Annual Meeting Theme
Exhibitors
About Philadelphia
About AERA
- Navigation and Settings Menu
Personal Schedule
Sign In
- Social Media Menu
Facebook
X (Twitter)
Test Form Development and Item Exposure
Sun, April 6, 8:15 to 9:45am, Convention Center, Floor: 100 Level, 117Session Type: Paper Session
Sub Unit
Chair
Papers
A Comparison of Exposure Control Procedures in Computerized Adaptive Testing Using the Generalized Partial Credit Model - Audrey J. Leroux, Georgia State University; Barbara G. Dodd, The University of Texas - Austin
Controlling Item Exposure for Response Time-Informed Item Selection in Computerized Adaptive Testing - Edison Choe, University of Illinois at Urbana-Champaign
If at First You Don’t Succeed, Retest on a Different Form - Richard A. Feinberg, National Board of Medical Examiners; Steven Arthur Haist, National Board of Medical Examiners; Mark R. Raymond, National Board of Medical Examiners
Instance Selection Methods for Automated Short Test Form Assembly - Yung-Chen Hsu, GED Testing Service; Tsung-Hsun Tsai, Research League, LLC
Three-Element Item Selection Procedures for Multiple Forms Assembly: An Item Matching Approach - Pei-Hua Chen, National Chiao Tung University