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Session Type: Invited Speaker Session
This special invited session provided by the Cognition and Assessment Special Interest Group (SIG) will ask leaders in the field about the promise and lost opportunities for merging cognition and testing. Be prepared for a highly interactive session.
Laine Bradshaw, University of Georgia - Athens
Susan Embretson, Georgia Institute of Technology
Paul D. Nichols, ACT, Inc.
Jonathan Templin, The University of Kansas