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The aim of this paper was to examine the relations among mental multiplication, working memory load (WML), and automaticity by alternating the difficulty level of task characteristics. In Experiment 1, involving 30 fifth graders, a 2 (WML) × 2 (automaticity) design was utilized. In Experiment 2, involving 21 high-achieving math learners and 21 low-achieving math learners in fourth grade, a 2 (WML) × 2 (automaticity) × 2 (achievement) design was utilized. There were statistically significant main effects of WML, automaticity, and group difference on students’ accuracy and response time. The simple effect of WML was more salient under conditions with low automaticity. Alternating difficulty level simultaneously in two dimensions of testing conditions posed an amplified impact on the low-achieving group.
Yi Ding, Fordham University
Ru-de Liu, Beijing Normal University
Dake Zhang, Rutgers University
Le Xu, Beijing Normal University
Jia Wang, Beijing Normal University