AERA Annual Meeting: John Shaw, University of Auckland

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John Shaw, University of Auckland

Mon, April 11
2:45 to 4:15pm
Marriott Marquis, Floor: Level Two, Marquis Salon 4
In Paper Session: Use of Various Rasch Measurement Models
On Paper: Finding Optimal Number of Rating Scale Categories in Multiple Mini-Interviews Using the Many-Facet Rasch Measurement Model
Non-Presenting Author

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