AERA Annual Meeting: 60.044 - Rasch Measurement SIG Business Meeting

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60.044 - Rasch Measurement SIG Business Meeting

Sun, April 30, 6:15 to 7:45pm, Henry B. Gonzalez Convention Center, Floor: River Level, Room 7B

Session Type: Business Meeting

Sub Unit

SIG-Rasch Measurement

Chair

Leigh M. Harrell-Williams, The University of Memphis

Papers

Exploring Rating Scale Category Formulations Across Polytomous Rasch and Mokken Models - Stefanie Anne Wind, The University of Alabama - Tuscaloosa

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