Psychometric Properties of the STEM Career Interest Survey: Assessment of High School Students in Taiwan

• In Event: Poster Session 15
  In Poster Session: Division D Poster Session

Abstract

This study examined the factor structure and reliability of the STEM Career Interest Survey, which is used with assessments of high school students in Taiwan (N = 590). Measurement models based on Social Cognitive Career Theory and discipline-specific dimensions were examined. Coefficients alpha and test-retest reliability were adequate for al subscales. Confirmatory factor analyses individual confirmed four discipline-specific subscales, i.e., Science, Technology, Engineering, and Mathematics. Results also show the hypothesized six-factor structure as well as secondary order factor structure of the SCCT model fit the data very well. Findings indicated that a modified Chinese version of STEM-CIS possesses adequate reliability and factorial validity, replicating the sound psychometric properties of the original English version of the STEM-CIS.

Authors

• Wei-Cheng Joseph Mau, Wichita State University

• shr-jya Chen

• Chi-Chau Lin

• Yun-Hwa L. Mau, Wichita High School Southeast