Differential Item Functioning Detection in Testlet Items: A Testlet-DINA Model Approach

• In Event: Cognitive Diagnosis Model: Innovative Methods and Applications

Abstract

CDMs have been utilized to asses student latent attributes in standardized testing. Differential item functioning exerts negative influence on test validity. Researchers have utilized DINA model to identify DIF on items. Yet such model might need to be revised when detecting DIF on testlet items. In light of this research gap, we utilized a testlet DINA model to conduct DIF analysis. Research findings have implications for test development.

Authors

• Wei Xu, The American Board of Anesthesiology

• M. David Miller, University of Florida