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The Impact of Item, Test, and Test-Taker Characteristics on Engagement During NAEP Assessments

Thu, April 21, 2:30 to 4:00pm PDT (2:30 to 4:00pm PDT), SIG Virtual Rooms, SIG-NAEP Studies Virtual Paper Session Room

Session Type: Symposium

Abstract

NAEP assessments serve a vital purpose by measuring U.S. students’ proficiencies in multiple domains, but they are low stakes for the students that complete them. Low test-taking engagement (TTE) has been found to occur for low-stakes assessments and can be a threat to outcome validity. Prior research has focused primarily on identifying low TTE and methods to filter those responses to improve outcome validity. The three papers in the present symposium adopt a different approach. Each paper investigates how test design decisions (e.g., item features, test assembly) and test-taker characteristics (e.g., proficiency level, opportunities to learn) interact to better understand how tests can be designed to minimize the occurrence of low TTE in a proactive manner.

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