Work-in-Progress: Examining the Validity and Reliability of STEM Expectancy-Value Survey at a Minority-Serving Institution (Poster 20)

• In Event: Thursday Poster Session 10:50 am
  In Poster Session: Division D Poster Session 1

Abstract

Survey validity and reliability is critical for rigorous educational research. We focus on examining an expectancy-value survey for its applicability at a minority serving institution (MSI), which serves student groups marginalized in STEM fields. We argue that it is critical to incorporate minoritized voices in the instrument validation process to overcome biases that may be rooted in dominant worldviews. We piloted the survey with 207 students at a small MSI. Initial exploratory factor analysis revealed good validity and reliability. However, further investigation through confirmatory factor analysis and qualitative focus groups with students may elucidate insights on the survey items and their overarching factor structures. We discuss the findings as an example of using critical methodologies in survey validation.

Authors

• Jeffrey Stransky, Rochester Institute of Technology

• Prateek Shekhar, New Jersey Institute of Technology