AERA Annual Meeting: Fairness in AI and Educational Measurement: Similarities and Differences

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Fairness in AI and Educational Measurement: Similarities and Differences

In Event: Division D International Committee Invited Session: Global Perspectives in Measurement and Research Methodologies: AI and Emerging Technologies

Fri, April 25, 1:30 to 3:00pm MDT (1:30 to 3:00pm MDT), The Colorado Convention Center, Floor: Meeting Room Level, Room 712

Abstract

This invited paper discusses AI and measurement practices.

Author

Ying Cheng, University of Notre Dame

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