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Session Type: Invited Speaker Session
This session includes three invited papers that overview international innovations in educational measurement and assessment, with particularly attention to innovative and emergent technologies.
Fairness in AI and Educational Measurement: Similarities and Differences - Ying Cheng, University of Notre Dame
Reimagining Assessment and Learning with Modern Psychometrics and Technological Advances - Jimmy de la Torre, University of Hong Kong
Navigating the AI Revolution in Educational Measurement: Opportunities and Challenges - Okan Bulut, University of Alberta