AERA Annual Meeting: Yuan Ge, University of Alabama

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Yuan Ge, University of Alabama

Mon, April 25
9:45 to 11:15am PDT (9:45 to 11:15am PDT)
SIG Virtual Rooms, SIG-Rasch Measurement Virtual Paper Session Room
In Paper Session: Rasch Models: Considerations and Use
On Paper: Identifying Response Styles Using Person Fit Analysis and Response-Styles Models
Presenting Author

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