Detecting Low-Effort Response Patterns in Computerized Adaptive Tests via a Nonparametric Approach

• In Event: Effort Responding

Abstract

We applied a nonparametric approach, hierarchical clustering, to group item response time data from 146,519 examinees in Grades 1-8 who completed the i-Ready Diagnostic, a large-scale CAT. We unveiled patterns of examinees’ low effort throughout CAT, which has important implications for future test development and effort-moderated response modeling.

Authors

• Dandan Chen Kaptur, Pearson

• Elizabeth Adele Patton, Curriculum Associates

• Logan Rome, CURRICULUM ASSOCIATES