Concurrent ATA: Integrating MST Simulation Factors into Automated Test Assembly

• In Event: GSIC Poster Session II

Abstract

The proposal introduces a concurrent automated test assembly approach for assembling multiple multistage test (MST) panels using mixed-integer linear programming (MIP). Integrating design factors during panel assembly reduces the effect of confounding factors and facilitates conclusions in the simulation study. Moreover, valuable optimization suggestions for the ATA process are included.

Authors

• Hong Chen, The University of Iowa

• YuLan Su, Center for Applied Linguistics