Item Exposure Control with Reverse Cumulative Sum of Exposure Counts in CAT

• In Event: Electronic Board Session IV

Abstract

To maintain measurement precision while controlling item exposure, we propose the Seq-SH procedure to emphasize exposure control early on and prioritize ability estimation later in CAT. The results indicated that Seq-SH can efficiently improve trait estimation by dynamically adjusting exposure control parameters and facilitating the use of popular items.

Authors

• Jyun-Hong Chen, National Cheng Kung University

• Hsiu-Yi Chao, Soochow University