Paper Summary

Direct link:

Investigating Aberrant Response Time Patterns Using Log-Likelihood Response Time Fit Index

Thu, April 16, 12:00 to 1:30pm, Sheraton, Floor: Fourth Level, Chicago VI&VII


A newly developed log-likelihood response time fit index is used to evaluate individual test-takers’ response time across test items, in an attempt to identify aberrant response time patterns and to determine whether the aberrant response time pattern is associated with abnormal item responses. Item performance in terms of item difficulty, time discrimination, and item intensity is investigated when flagged aberrant response times and item responses are included or not.