SIG-Rasch Measurement

Duanli Yan, ETS

Finding Optimal Number of Rating Scale Categories in Multiple Mini-Interviews Using the Many-Facet Rasch Measurement Model - Vernon Mogol, University of Auckland; Warwick Bagg, University of Auckland; John Shaw, University of Auckland; Phillippa Poole, University of Auckland; John Monigatti

Many-Faceted Rasch Measurement: Assessing Rater Errors in Performance Assessment - Priyalatha Govindasamy, University of Denver; Kathy E. Green, University of Denver; Maria del Carmen Salazar, University of Denver

Testlet Effects on Pass/Fail Decisions Under Competing Rasch Models - Kari Hodge, NACE International Institute; Grant B. Morgan, Baylor University

Using Person Response Functions to Investigate Areas of Person Misfit Related to Item Characteristics - Angela Adrienne Walker, Emory University; Jeremy Kyle Jennings, University of Georgia - Athens; George Engelhard, University of Georgia

Duanli Yan, ETS